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製品・サービス
製品情報
半導体
市場と変化
ソリューションとソフトウェア
Platform Architecture
Materials Library
Retrieve materials properties critical to material-device codesign
Defect Spectroscopy
Extract material properties and atomic defect density, energies and profiles - fingerprint your materials and processes
Virtual DoE
Quickly narrow materials choices through virtual experiments for PPACt acceleration
Establishing materials-to-device & device-to-materials feedforward/feedback loops is essential to accelerating learning cycles and generating actionable insights critical for R&D, Technology Development, Ramp and Yield.
