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With minimal mechanical motion the AKT EBT TFT array tester realizes high-reliability, low scheduled down time and low running cost. The e-beam array test systems feature fast, large area beam positioning with several e-beams in parallel, achieving high-throughput. Ultimate small beam spot size and accuracy beam positioning enable ultra-high resolution applications without limiting further reduction of pixel size as resolution of displays increases. The systems’ non-contact test technology ensures safe testing of high-value LCD and OLED panels without damaging or scratching the display.